Microtronic Announces Real-time Macro Defect Monitoring – Within Semiconductor Processing Equipment
- Friday, July 17, 2020, 7:11
- PR Newswire
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HAWTHORNE, N.Y., July 17, 2020 /PRNewswire/ — SEMICON West 2020 – Microtronic, maker of high-speed full-wafer macro defect inspection systems and software, has just announced an innovative new way to automatically detect and manage wafer processing defects, beginning at the source – from…
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